CMOS mixed-signal circuit process variation sensitivity characterization for yield improvement

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2006, Pages 365-368

  Kim, Daeik ^a   Cho, Ongyeun ^a   Kim, Jonghae ^a   Plouchart, Jean Olivier ^a   Trzcinski, Robert ^a   Ahlgren, David ^a  

^a IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OSCILLATION FREQUENCY; PROCESS VARIATION; SENSITIVITY CHARACTERIZATION; YIELD IMPROVEMENT;

INTEGRATED CIRCUIT MANUFACTURE; SILICON ON INSULATOR TECHNOLOGY; THRESHOLD VOLTAGE; WSI CIRCUITS;

CMOS INTEGRATED CIRCUITS;

EID: 39049149462     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2006.320950     Document Type: Conference Paper

References (7)

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