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Surface and Coatings Technology

Volumn 202, Issue 11, 2008, Pages 2399-2402

Corrosion resistance of TiO2 films grown on stainless steel by atomic layer deposition

(3) Shan, C X a Hou, Xianghui a Choy, Kwang Leong a

a UNIVERSITY OF NOTTINGHAM (United Kingdom)

Author keywords

Atomic layer deposition; Corrosion; Stainless steel; Titanium dioxide

Indexed keywords

CHARACTERIZATION; CORROSION RESISTANCE; ELECTROCHEMISTRY; FILM GROWTH; STAINLESS STEEL; SUBSTRATES; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS;

EQUILIBRIUM CORROSION POTENTIAL; IMPEDANCE SPECTRA; STAINLESS STEEL SUBSTRATES; TITANIUM DIOXIDE FILMS;

ATOMIC LAYER DEPOSITION;

ATOMIC LAYER DEPOSITION; CHARACTERIZATION; CORROSION RESISTANCE; ELECTROCHEMISTRY; FILM GROWTH; STAINLESS STEEL; SUBSTRATES; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS;

EID: 38949150792 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/j.surfcoat.2007.08.066 Document Type: Article

Times cited : (242)

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