Properties of brush plated CdxZn1-xTe thin films

Solar Energy

Volumn 82, Issue 3, 2008, Pages 220-225

  Murali, K R ^a  

^a CENTRAL ELECTROCHEMICAL RESEARCH INSTITUTE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; CURRENT DENSITY; LIGHT ABSORPTION; PLATING; TELLURIUM COMPOUNDS; X RAY DIFFRACTION; ZINC SULFIDE;

BRUSH PLATING TECHNIQUE; CUBIC PHASE;

THIN FILMS;

CADMIUM COMPOUNDS; CURRENT DENSITY; LIGHT ABSORPTION; PLATING; TELLURIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION; ZINC SULFIDE;

ABSORPTION; CADMIUM; MEASUREMENT METHOD; ROUGHNESS; TELLURIUM; ZINC;

EID: 38949135988     PISSN: 0038092X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solener.2007.07.007     Document Type: Article

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