Determination of optical constants of Cd1-xZnxTe thin films by spectroscopic ellipsometry

Thin Solid Films

Volumn 424, Issue 1, 2003, Pages 66-69

  Prabakar, K ^a   Sridharan, M ^a   Narayandass, Sa K ^a   Mangalaraj, D ^a   Gopal, Vishnu ^b  

^a BHARATHIAR UNIVERSITY   (India)

^b SOLID STATE PHYSICS LABORATORY   (India)

Author keywords

Cd1 xZnxTe; Evaporation; Optical constants; Spectroscopic ellipsometry

Indexed keywords

ABSORPTION; ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; ELLIPSOMETRY; PERMITTIVITY; PHOTONS; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

OPTICAL CONSTANTS;

THIN FILMS;

EID: 0037460363     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00915-X     Document Type: Conference Paper

References (24)

1. Gonzalez-Hernandez J., Lopez-cruz E., Allred D.D., Allred W.P. J. Vac. Sci. Technol. A. 8:1990;3255.
2. Kennedy J.J., Amirtharaj P.M., Boyd P.R., Qudri S.B. J. Cryst. Growth. 86:1988;93.
3. Scyoc J.M.V., Lund J.C., More D.H., Antolak A.J., Olsen R.W., James R.B., Schieber M., Yoon H., Goorsky M.S., Toney J.E., Schlesinger J.E. J. Electron. Mats. 25:1996;1323.
4. Singh M., Mumcuoglu E. IEEE Trans. Nucl. Sci. 45:1998;1158.
5. Tungs T. J. Cryst. Growth. 86:1998;161.
6. Goela J.S., Taylor R.L. Appl. Phys. Lett. 51:1987;928.
7. Lee T.S., Choi K.K., Jeong Y.T., Kim K.K. J. Electron. Mats. 26:1997;552.
8. Bell J.L., Sen S. J. Vac. Sci. Technol. A. 3:1985;112.
9. Yao H., Erickson J.C., Lim L.A., James R.B. Thin Solid Films. 313-314:1998;351.
10. Azzam R.M.A., Bashara N.M. Ellipsometry and Polarized Light. 1977;North-Holland, Amsterdam.
11. Vina L., Logothetidis S., Cardona M. Phys. Rev. B. 36:1987;4821.
12. Aspines D.E., Studna A.A. Phys. Rev. B. 27:1983;985.
13. Yoshikawa H., Adachi S. Jpn. J. Appl. Phys. 36:1997;6237.
14. Caradona M., Greenway D.L. Phys. Rev. 131:1963;98.
15. Sato K., Adachi S. J. Appl. Phys. 73:1993;926.
16. Ninomiya S., Adachi S. J. Appl. Phys. 78:1995;4681.
17. Adachi S., Tauguchi T. Phys. B. 43:1991;9569.
18. Suzuhi K.-i., Adachi S. J. Appl. Phys. 83:1998;1018.
19. Aspines D.E. J. Vac. Sci. Technol. 17:1980;1057.
20. Harbeke G., Abeles F. Optical Properties of Solids. 1972;21 North-Holland, Amsderdam.
21. Walter J.P., Cohen M.L. Phys. Rev. B. 1:1970;2661.
22. Adachi S., Kimura K. Jpn. J. Appl. Phys. 32:1993;3888.
23. Yao H.W., Erickson J.C., Barber H.B., James R.B., Herman H. J. Electron. Mats. 28:1999;760.
24. Prasada Rao, Hussain O.Md., Naidu B.S., Jayarama Reddy P. Adv. Mater. Opt. Electron. 7:1997;109.