Measuring van der Waals and electrostatic forces for an atomic force microscope probe contacting with metal surfaces

Technical Physics Letters

Volumn 34, Issue 1, 2008, Pages 17-21

  Dedkov, G V ^a   Dedkova, E G ^a   Tegaev, R I ^a   Khokonov, Kh B ^a  

^a KABARDINO BALKARIAN STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 38849203710     PISSN: 10637850     EISSN: None     Source Type: Journal    
DOI: 10.1134/s1063785008010069     Document Type: Article

References (13)

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