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Volumn 103, Issue 2, 2008, Pages

Determination of solid phase chemical diffusion coefficient and density of states by electrochemical methods: Application to iridium oxide-based thin films

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRONIC DENSITY OF STATES; IRIDIUM COMPOUNDS; SILVER; SPUTTER DEPOSITION; THIN FILMS;

EID: 38849173063     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2831484     Document Type: Article
Times cited : (27)

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