Using a high-value resistor in triangle comparisons of electrical standards

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 590-593

  Elmquist, Randolph E ^a   Zimmerman, Neil M ^a   Huber, William H ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b GE GLOBAL RESEARCH   (United States)

Author keywords

Fundamental constants; Josephson effect; Quantum Hall effect; Resistance standards; Single electron tunneling

Indexed keywords

CALIBRATION; COMPARATOR CIRCUITS; CRYOGENICS; ELECTRON TUNNELING; HALL EFFECT DEVICES; JOSEPHSON JUNCTION DEVICES; MAGNETIC FLUX; SPURIOUS SIGNAL NOISE; SQUIDS; STANDARDS; STATISTICAL METHODS; VOLTAGE MEASUREMENT;

CRYOGENIC CURRENT COMPARATOR; CRYOGENIC RESISTOR; QUANTIZED HALL RESISTANCE; VOLTAGE DETECTOR;

RESISTORS;

EID: 0037899506     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.811578     Document Type: Article

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