Crystallization kinetics of amorphous equiatomic NiTi thin films: Effect of film thickness

Journal of Applied Physics

Volumn 103, Issue 2, 2008, Pages

  Wang, X ^a   Rein, M ^b   Vlassak, J J ^a  

^a HARVARD UNIVERSITY   (United States)

^b TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION KINETICS; FILM THICKNESS; NICKEL COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLITE NUCLEATION; NITI FILMS;

THIN FILMS;

EID: 38849113240     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2829811     Document Type: Article

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