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Volumn 129, Issue 2, 2007, Pages 167-171

Cross-verification of thermal characterization of a microcooler

Author keywords

[No Author keywords available]

Indexed keywords

HEAT FLUX; HEAT RESISTANCE; HEAT TRANSFER; MICROCHANNELS; TEMPERATURE SENSORS; TRANSISTORS;

EID: 38749089402     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2721089     Document Type: Article
Times cited : (10)

References (13)
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    • Air-Cooling Extension-Performance Limits for Processor Cooling Applications
    • San Jose, CA, March 11-13, pp
    • Sauciuc, I. et al., 2003, "Air-Cooling Extension-Performance Limits for Processor Cooling Applications," Proceedings of the 20th SEMI-THERM Symposium, San Jose, CA, March 11-13, pp. 74-80.
    • (2003) Proceedings of the 20th SEMI-THERM Symposium , pp. 74-80
    • Sauciuc, I.1
  • 2
    • 0037277870 scopus 로고    scopus 로고
    • Development of a High Performance Heat Sink Based on Screen-Fin Technology
    • San Jose, CA, March 11-13, pp
    • Li, C., and Wirtz, R. A., 2003, "Development of a High Performance Heat Sink Based on Screen-Fin Technology," Proceedings of the 20th SEMI-THERM Symposium, San Jose, CA, March 11-13, pp. 53-60.
    • (2003) Proceedings of the 20th SEMI-THERM Symposium , pp. 53-60
    • Li, C.1    Wirtz, R.A.2
  • 3
    • 28144432265 scopus 로고    scopus 로고
    • Advances in Mesoscale Thermal Management Technologies for Microelectronics
    • Sophia-Antipolis, France, 29 September-1 October, pp
    • Garimella, S. V., 2004, "Advances in Mesoscale Thermal Management Technologies for Microelectronics," Proceedings of the 10th THERMINIC Workshop, Sophia-Antipolis, France, 29 September-1 October, pp. 185-206.
    • (2004) Proceedings of the 10th THERMINIC Workshop , pp. 185-206
    • Garimella, S.V.1
  • 4
    • 38749116829 scopus 로고    scopus 로고
    • Hot Spot Cooling Using Embedded Thermoelectric Coolers
    • Dallas, TX, March 14-16
    • Snyder, G. J. et al., 2006, "Hot Spot Cooling Using Embedded Thermoelectric Coolers," Proceedings of the 22nd SEMI-THERM Symposium, Dallas, TX, March 14-16.
    • (2006) Proceedings of the 22nd SEMI-THERM Symposium
    • Snyder, G.J.1
  • 6
    • 85199295288 scopus 로고    scopus 로고
    • www.micred.com/t3ster.html.
  • 7
    • 0018262034 scopus 로고
    • Measuring Thermal Resistance is the Key to a Cool Semiconductor
    • Siegal, B. S., 1978, "Measuring Thermal Resistance is the Key to a Cool Semiconductor," Electronics, 51, pp. 121-126.
    • (1978) Electronics , vol.51 , pp. 121-126
    • Siegal, B.S.1
  • 8
    • 0024069775 scopus 로고
    • Fine Structure of Heat Flow Path in Semiconductor Devices: A Measurement and Identification Method
    • Székely, V., and Tran, V. B., 1988, "Fine Structure of Heat Flow Path in Semiconductor Devices: A Measurement and Identification Method," Solid-State Electron., 31, pp. 1363-1368.
    • (1988) Solid-State Electron , vol.31 , pp. 1363-1368
    • Székely, V.1    Tran, V.B.2
  • 9
    • 0032640876 scopus 로고    scopus 로고
    • New Way of Thermal Transient Testing
    • San Diego, CA, March 9-11, pp
    • Székely V. et al., 1999, "New Way of Thermal Transient Testing," Proceedings of the 15th SEMI-THERM Symposium, San Diego, CA, March 9-11, pp. 182-188.
    • (1999) Proceedings of the 15th SEMI-THERM Symposium , pp. 182-188
    • Székely, V.1
  • 10
    • 0036212684 scopus 로고    scopus 로고
    • Determining Partial Thermal Resistances With Transient Measurements and Using the Method to Detect Die Attach Discontinuities
    • San Jose, CA, March 10-14, pp
    • Rencz, M. et al., 2002, "Determining Partial Thermal Resistances With Transient Measurements and Using the Method to Detect Die Attach Discontinuities," Proceedings of the 18th SEMI-THERM Symposium, San Jose, CA, March 10-14, pp. 15-20.
    • (2002) Proceedings of the 18th SEMI-THERM Symposium , pp. 15-20
    • Rencz, M.1
  • 13
    • 0032028593 scopus 로고    scopus 로고
    • Identification of RC Networks by Deconvolution: Chances and Limits
    • IEEE Trans. Circuits Syst, 1: Fundam. Theory Appl
    • Székely, V., 1998, "Identification of RC Networks by Deconvolution: Chances and Limits," IEEE Trans. Circuits Syst., 1: Fundam. Theory Appl., 45(3), pp. 244-258.
    • (1998) , vol.45 , Issue.3 , pp. 244-258
    • Székely, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.