Thickness-dependent rectifying behavior in heterojunctions of TbMnO3/Nb-1.0 wt.%-doped SrTiO3

Thin Solid Films

Volumn 516, Issue 8, 2008, Pages 2292-2295

  Cui, Yimin ^a   Zhang, Liuwan ^b   Wang, Rongming ^a   Xie, Guanlin ^b  

^a BEIHANG UNIVERSITY   (China)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

Electrical properties and measurements; Heterojunction; Rare earth manganite; Rectifying properties; Thickness dependent

Indexed keywords

DOPING (ADDITIVES); ELECTRIC PROPERTIES; HETEROJUNCTIONS; LOW TEMPERATURE EFFECTS; SINGLE CRYSTALS; TERBIUM COMPOUNDS; THICKNESS MEASUREMENT;

RARE EARTH MANGANITES; RECTIFYING PROPERTIES;

STRONTIUM COMPOUNDS;

EID: 38649086406     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.08.063     Document Type: Article

References (20)

1. Tanaka H., Zhang J., and Kawai T. Phys. Rev. Lett. 88 (2002) 027204
2. Sugiura M., Uragou K., Noda M., Tachiki M., and Kobayashi T. Jpn. J. 38 (1999) 2675
3. Lu H.B., Dai S.Y., Chen Z.H., Liu L.F., Gou H.Z., Xiang W.F., Fei Y.Y., He M., Zhou Y.L., and Yang G.Z. Chin. Phys. Lett. 20 (2003) 137
4. Hu F.X., Gao J., Sun J.R., and Shen B.G. Appl. Phys. Lett. 83 (2003) 1869
5. Mitra C., Raychaudhuri P., Kobernik G., Dorr K., Muller K.H., Schultz L., and Pinto R. Appl. Phys. Lett. 79 (2001) 2408
6. Watanabe Y. Phys. Rev., B 57 (1998) R5563
7. Sun J.R., Xiong C.M., Shen B.G., Wang P.Y., and Weng Y.X. Appl. Phys. Lett. 84 (2004) 2611
8. Mathews S., Ramesh R., Venkatesan T., and Benedetto J. Science 276 (1997) 238
9. Xi X.X., Li Q., Doughty C., Kwon C., Bhattacharya S., Findikoglu A.T., and Venkatesan T. Appl. Phys. Lett. 59 (1991) 3470
10. Dale D., Fleet A., Brock J.D., and Suzuki Y. Appl. Phys. Lett. 82 (2003) 3725
11. Mitra C., Raychaudhuri P., Dorr K., Muller K.H., Schultz L., Oppeneer P.M., and Wirth S. Phys. Rev. Lett. 90 (2003) 017202
12. Carron L.M., Benitez J.S., and de. Andres A. J. Solid State Chem. 171 (2003) 313
13. Kimura T., Goto T., Shintani H., Ishizaka K., Arima T., and Tokura Y. Nature 426 (2003) 55
14. Alonso J.A., Lope M.J.M., Casais M.T., and Diaz M.T.F. Inorg. Chem. 39 (2000) 917
15. Goto T., Kimura T., Lawes G., Ramirez A.P., and Tokura Y. Phys. Rev. Lett. 92 (2004) 257201
16. Cui Y.M., Zhang L.W., and Wang R.M. Solid State Commun. 138 (2006) 481
17. Cui Y.M., Zhang L.W., Wang C.C., and Xie G.L. Appl. Phys. Lett. 86 (2005) 203501
18. Cui Y.M., Wang C.C., and Cao B.S. Solid State Commun. 133 (2005) 641
19. Luke S., Peng J., Xi X.X., Moeckly H.B., and Alpay S.P. Appl. Phys. Lett. 83 (2003) 4592
20. Haeni J.H., Irvin P., Chang W., Uecker R., Reiche P., Li Y.L., Choudhury S., Tian W., Hawley M.E., Craigo B., Tagantsev A.K., Pan X.Q., Streiffer S.K., Chen L.Q., Kirchoefer S.W., Levy J., and Schlom D.G. Nature 430 (2004) 758