Preferred orientation, grain sizes and grain boundaries of chalcopyrite-type thin films

Materials Research Society Symposium Proceedings

Volumn 1012, Issue , 2007, Pages 321-326

  Abou Ras, Daniel ^a   Nichterwitz, Melanie ^a   Kaufmann, Christian A ^a   Schorr, Susan ^a   Schock, Hans Werner ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHALCOGENIDES; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; SOLAR CELLS; X RAY DIFFRACTION; COPPER COMPOUNDS; TEXTURES; THIN FILMS;

ELECTRON-BACKSCATTER DIFFRACTION (EBSD); GRAIN-SIZE DISTRIBUTIONS; TWIN BOUNDARIES; CHALCOPYRITE-TYPE; ELECTRON BACK SCATTER DIFFRACTION; GRAIN-SIZE DISTRIBUTION; LOCAL GRAIN ORIENTATION; LOG-NORMAL DISTRIBUTION; PREFERRED ORIENTATIONS; TEXTURE ANALYSIS;

THIN FILMS; SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 38549169462     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1012-y09-03     Document Type: Conference Paper

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