Comparative study between interferometric and Z-scan techniques for thermal lensing characterization

Optics Communications

Volumn 281, Issue 6, 2008, Pages 1323-1330

  Escalona, Rafael ^a  

^a FEMTO ST INSTITUTE   (France)

Author keywords

High sensitivity measurements; Interferometry; Thermal lensing; Z scan technique

Indexed keywords

CONTINUOUS WAVE LASERS; INTERFEROMETRY; PHASE SHIFT; REFRACTIVE INDEX; WAVEFRONTS;

ABSORPTION COEFFICIENTS; HIGH SENSITIVITY MEASUREMENTS; PHASE SHIFT DISTORTIONS; THERMAL LENSING; Z-SCAN TECHNIQUE;

LENSES;

EID: 38549167063     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2007.11.036     Document Type: Article

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