Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing

Optics Letters

Volumn 21, Issue 2, 1996, Pages 101-103

  Marcano O, A ^a   Maillotte, H ^b   Gindre, D ^b   Metin D ^b  

^a INSTITUTO VENEZOLANO DE INVESTIGACIONES CIENTÍFICAS   (Venezuela)

^b UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001575462     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.000101     Document Type: Article

References (7)

1. M. Sheik-Bahae, A. A. Said, and E. W. Van Stryland, Opt. Lett. 14, 955 (1989).
2. M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, and E. W. Van Stryland, IEEE J. Quantum Electron. 26, 760 (1990).
3. J. A. Hermann and P. B. Chapple, J. Mod. Opt. 38, 1035 (1991).
4. W. Zhao and P. Palffy-Muhoray, Appl. Phys. Lett. 63, 1613 (1993).
5. T. Xia, D. J. Hagan, M. Sheik-Bahae, and E. W. Van Stryland, Opt. Lett. 19, 317 (1994).
6. A. Marcano O., G. Da Costa, and J. A. Castillo, Opt. Eng. 32, 1125 (1993).
7. A. Marcano O. and J. Castillo, Pure Appl. Opt. 3, 339 (1994).