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Volumn 21, Issue 2, 1996, Pages 101-103

Picosecond nonlinear refraction measurement in single-beam open Z scan by charge-coupled device image processing

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001575462     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.000101     Document Type: Article
Times cited : (49)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.