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Optics Communications

Volumn 134, Issue 1-6, 1997, Pages 529-536

Sensitivity of the total beam profile distortion Z-scan for the measurement of nonlinear refraction

(3) Hernandez F E a Marcano, A O b,c Maillotte, H b

a FACULTAD DE CIENCIAS (Venezuela)

b UNIVERSITÉ DE FRANCHE COMTÉ (France)

c INSTITUTO VENEZOLANO DE INVESTIGACIONES CIENTÍFICAS (Venezuela)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DISULFIDE; ETHANOL; LASER BEAMS; LIGHT REFRACTION; NONLINEAR OPTICS; REFRACTIVE INDEX; SENSITIVITY ANALYSIS; SOLUTIONS; THERMAL EFFECTS;

ECLIPSING Z SCAN; MALACHITE GREEN; THERMAL NONLINEAR REFRACTION; TOTAL BEAM PROFILE DISTORTION Z SCAN;

OPTICAL KERR EFFECT;

EID: 0030784197 PISSN: 00304018 EISSN: None Source Type: Journal
DOI: 10.1016/S0030-4018(96)00554-8 Document Type: Article

Times cited : (23)

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