Morphological, optical and electrical properties of γ CuCl deposited by vacuum evaporation

Journal of Materials Science: Materials in Electronics

Volumn 19, Issue 2, 2008, Pages 99-101

  Lucas, Francis Olabanji ^a   Mitra, A ^a   McNally, P J ^a   O'Reilly, L ^a   Daniels, S ^a   Natarajan, Gomathi ^a   Durose, K ^b   Proskuryakov, Y Y ^b   Cameron, D C ^c  

^a DUBLIN CITY UNIVERSITY   (Ireland)

^b DURHAM UNIVERSITY   (United Kingdom)

^c LAPPEENRANTA UNIVERSITY OF TECHNOLOGY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CATIONIC CONDUCTION; ELECTRONIC CONDUCTION; PHOTOLUMINESCENCE MEASUREMENTS; SURFACE TOPOLOGIES;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; FILM GROWTH; MORPHOLOGY; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SUBSTRATES; SURFACE ROUGHNESS; THERMAL EFFECTS; THIN FILMS; VACUUM EVAPORATION; X RAY DIFFRACTION ANALYSIS;

COPPER COMPOUNDS;

EID: 38549142429     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-007-9309-2     Document Type: Conference Paper

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