Microstructural characterization of high-thermal-conductivity SiC ceramics

Journal of the European Ceramic Society

Volumn 24, Issue 14, 2004, Pages 3685-3690

  Nakano, Hiromi ^a   Watari, Koji ^b   Kinemuchi, Yoshiaki ^b   Ishizaki, Kozo ^c   Urabe, Kazuyori ^a  

^a RYUKOKU UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Electron microscopy; Grain boundaries; SiC; Sintering; Thermal conductivity

Indexed keywords

BERYLLIUM COMPOUNDS; CERAMIC MATERIALS; CRYSTALLINE MATERIALS; IMPURITIES; MICROSTRUCTURE; PRECIPITATION (CHEMICAL); THERMAL CONDUCTIVITY; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLINE PHASES; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; HIGH-THERMAL-CONDUCTIVITY SIC CERAMIC; TRIPLE-GRAIN JUNCTIONS;

SILICON CARBIDE;

CERAMICS;

EID: 3843118052     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2003.12.019     Document Type: Article

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