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Volumn 507-510, Issue , 2002, Pages 630-635
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Three-dimensional structures formed with C60 and amorphous silicon - A feasibility study on the formation of a composite material
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Author keywords
Amorphous surfaces; Fullerenes; Photoelectron spectroscopy; Silicon; Surface structure, morphology, roughness, and topography
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Indexed keywords
AMORPHOUS SILICON;
BAND STRUCTURE;
COMPOSITE MATERIALS;
CRYSTALLINE MATERIALS;
FERMI LEVEL;
FULLERENES;
HETEROJUNCTIONS;
MORPHOLOGY;
THIN FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
ULTRAVIOLET SPECTROSCOPY;
X RAY PHOTOELECTRON SPECTROSCOPY;
AMORPHOUS SURFACES;
SURFACE ROUGHNESS;
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EID: 0036608542
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(02)01327-4 Document Type: Conference Paper |
Times cited : (7)
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References (30)
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