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Volumn 556-557, Issue , 2007, Pages 529-532
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Nanowire reconstruction on the 4H-SiC(1102) surface
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Author keywords
4H SiC; AES; Auger electron spectroscopy; LEED; Low energy electron diffraction; Nanowire; One dimensional electronic state; Reconstruction; Scanning tunneling microscopy; SiC(1102); STM; Surface structure
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Indexed keywords
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EID: 38349187832
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/0-87849-442-1.529 Document Type: Conference Paper |
Times cited : (4)
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References (4)
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