Microstructure and recording mechanism of Bi-Fe-(N) layer for high-density write-once optical disk

Applied Physics Letters

Volumn 92, Issue 2, 2008, Pages

  Mai, Hung Chuan ^a   Hsieh, Tsung Eong ^a   Jeng, Shiang Yao ^b   Chen, Chong Ming ^b   Wang, Jen Long ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b Prodisc Technology Inc   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; BIT ERROR RATE; MICROSTRUCTURE; OPTICAL DISK STORAGE; SIGNAL TO NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

COARSE GRANULAR STRUCTURE; RECORDING MECHANISM;

THIN FILMS;

EID: 38349186607     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2828335     Document Type: Article

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