Cu-Si bilayers as storage medium in optical recording

Applied Physics Letters

Volumn 86, Issue 22, 2005, Pages 1-3

  Kuiper, A E T ^a   Vullers, R J M ^a   Pasquariello, D ^a   Naburgh, E P ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER ALLOYS; DISKS (MACHINE COMPONENTS); HIGH RESOLUTION ELECTRON MICROSCOPY; LIGHT EMITTING DIODES; PHASE DIAGRAMS; THERMAL EFFECTS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

BINARY PHASE DIAGRAMS; CU-SI BILAYERS; SILICIDE LAYERS; STORAGE MEDIUM;

OPTICAL RECORDING;

EID: 20844439681     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1944205     Document Type: Article

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