Materials issues in blue recording

MRS Bulletin

Volumn 31, Issue 4, 2006, Pages 308-313

  Kuiper, A E T ^a   Van Pieterson, L ^a  

^a NONE

Author keywords

Film; Optical properties; Phase transformation

Indexed keywords

ACTIVATION ENERGY; CRYSTALLIZATION; OPTICAL PROPERTIES; PHASE TRANSITIONS; THERMAL EFFECTS; THIN FILMS;

PHASE-CHANGE RECORDING LAYERS; RECRYSTALLIZATION; ROOM-TEMPERATURE STABILITY;

MATERIALS SCIENCE;

EID: 33646193185     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2006.69     Document Type: Article

References (40)

1. H. van Houten and W. Leibbrandt, Commun. ACM 43 (2000) p. 65.
2. J. Hellmig, Physics World 17 (7) (2004) p. 21.
3. A.B. Marchant, Optical Recording - A Technical Overview, Ch. 12.4 (Addison-Wesley Publishing, Reading, Mass., 1990).
4. O. Kasono, M. Sato, T. Sugimoto, Y. Kojima, and M. Katsumura, Jpn. J. Appl. Phys. 43 (2004) p. 5078.
5. J.H.M. Neijzen, E.R. Meinders, and H. van Santen, Jpn. J. Appl. Phys. 43 (2004) p. 5047.
6. E. Ito, Y. Kawaguchi, M. Tomiyama, S. Abe, and E. Ohno, Jpn. J. Appl. Phys. 44 (2005) p. 3574.
7. K. Osato, S. Kai, Y. Takemoto, T. Nakao, K. Nakagawa, A. Kouchiyama, and K. Aratani, in OSA Trends in Optics and Photonics (TOPS), Vol. 88, Optical Data Storage, OSA Technical Digest, Postconference Edition (Optical Society of America, Washington DC, 2003) p. 52.
8. M. Miyamoto, J. Ushiyama, K, Umezawa, A. Kashivvakura, and R. Tamura, ISOM/ODS 2002 Tech. Dig. (2002) p. 416.
9. Y. Kageyama, H. Iwasaki, M. Hariagaya, and Y. Ide, Jpn. J. Appl. Phys. 35 (1996) p. 500.
10. L. van Pieterson, J.C.N. Rijpers, and J. Hellmig, Jpn. J. Appl. Phys. 43 (2004) p. 4974.
11. G.F. Zhou, H.J. Borg, J.C.N. Rijpers, M.H.R. Lankhorst, and J.J.L. Horikx, Proc. SPIE 4090 (2000) p. 108.
12. H.J. Borg, M. van Schijndel, J.C.N. Rijpers, M. Lankhorst, G. Zhou, M.J. Dekker, I.P.D. Ubbens, and M. Kuijper, Jpn. J. Appl. Phys. 40 (2001) p. 1592.
13. T. Matsunaga and N. Yamada, presented at E*PCOS 2004 (Balzers, Liechtenstein, 2004), available at http://www.epcos.org/pdf_2004/ 07paper_matsunaga.pdf (accessed February 2006).
14. T. Nishihara, R. Kojima, N. Miyagawa, and N. Yamada, Jpn. J. Appl. Phys. 44 (2005) p. 3037.
15. K. Yusu, S. Ashida, N. Nakamura, N. Ohmachi, N. Morishita, A. Ogawa, and K. Ichihara, Jpn. J. Appl. Phys. 42 (2003) p. 858.
16. N. Ohmachi, S. Ashida, K. Yusu, T. Nakai, K. Ichihara, and N. Nakamura, Jpn. J. Appl. Phys. 43 (2004) p. 4978.
17. N. Ohmachi, N. Morishita, K. Yusu, N. Nakamura, T. Nakai, and S. Ashida, Jpn. J. Appl. Phys. 45 (2006) p. 1210.
18. M. Shinotsuka, N. Onagi, and M. Harigaya, Jpn. J. Appl. Phys. 39 (2000) p. 976.
19. M. Shinotsuka, H. Iwasa, R. Furukawa, S. Murata, M. Abe, and Y. Kageyama, Jpn. J. Appl. Phys. 41 (2002) p. 1693.
20. J. Hellmig, A.V. Mijiritskii, H.J. Borg, K. Musialková, and P. Vromans, Jpn. J. Appl. Phys. 42 (2003) p. 848.
21. H. Borg, M. van Schijndel, J.C.N. Rijpers, M.H.R. Lankhorst, G. Zhou, M.J. Dekker, I.P.D. Ubbens, and M. Kuijper, Jpn. J. Appl. Phys. 40 (2001) p. 1592.
22. A. Mijiritskii, J. Hellmig, H. Borg, and E. Memders, Jpn. J. Appl. Phys. 41 (2002) p. 1688.
23. L. van Pieterson, M.H.R. Lankhorst, M. van Schijndel, A.E.T. Kuiper, and J.H.J. Roosen, J. Appl. Phys. 97 083520 (2005).
24. M.H.R. Lankhorst, J. Non-Cryst. Solids 297 (2002) p. 210.
25. K. Takazawa, N. Morishita, Y. Ootera, K. Umezawa, N. Nakamura, and S. Morita, presented at ISOM/ODS'05, ThB3 (2005).
26. H. Nishiwaki, K. Kitano, H. Nakajima, E. Muramatsu, S. Taniguchi, A. Inoue, F. Yokogawa, M. Horie, K. Kiyono, T. Miyazawa, and Y. Kurose, Jpn. J. Appl. Phys. 45 (2006) p. 1452.
27. H. Kubo, Y. Kurose, T. Miyazawa, T. Kawano, H. Takeshima, Y. Nagataki, H. Ota, and R. Tamura, presented at ISOM/ODS'05, PD-3 (2005).
28. T. Saito, Jpn. J. Appl. Phys. 43 (2004) p. 8085.
29. B-M. Chen, H-F. Chea R-L. Yeh, and J-M. Chung, Jpn. J. Appl. Phys. 43 (2004) p. 5018;
30. R-L. Yeh, H-H. Chang, and B-M. Chen, Proc. ODS 2004 (2004) p. 55 and p. 58.
31. Y-C. Her and C-W. Chen, presented at ISOM/ODS'05, WP18 (2005).
32. P-F. Yen, J-P. Chen, C-Y. Wu, A-T. Lee, C-Y. Hsieh, and T-R. Jeng, presented at ISOM/ODS'05, TuP20 (2005).
33. A.E.T. Kuiper, R.J.M. Vullers, and D. Pasquariello, presented at ISOM/ODS'05, ThB2 (2005).
34. N. Kato, M. Yamaguchi, and T. Takishita, Jpn. J. Appl. Phys. 45 (2006) p. 1426.
35. Y. Hosoda, A. Mitsumori, M. Sato, and M. Yamaguchi, Jpn. J. Appl. Phys. 43 (2004) p. 4997.
36. M. Aoshima, H. Inoue, K. Mishima, H. Hirata, and H. Utsunomiya, U.S. Patent Application No. 2003/0190551 Al (October 9, 2003).
37. H. Inoue, K. Mishima, M. Aoshima, H. Hirata, T. Kato, and H. Utsunomiya, Jpn. J. Appl. Phys. 42 (2003) p. 1059.
38. A.E.T. Kuiper, R.J.M. Vullers, D. Pasquariello, and E. Naburgh, Appl. Phys. Lett. 86 221921 (2005).
39. R.J.M. Vullers, A.E.T. Kuiper, and D. Pasquariello, Jpn. J. Appl. Phys. 45 (2006) p. 1219.
40. T.B. Massalski, Binary Alloy Phase Diagrams, 2nd ed. (ASM International, Materials Park, OH, 1990) p. 1447.