Time-resolved ultrafast carrier dynamics in as-grown nanocrystalline silicon films: The effect of film thickness and grain boundaries

Physica Status Solidi - Rapid Research Letters

Volumn 2, Issue 1, 2008, Pages 19-21

  Lioudakis, Emmanouil ^a   Othonos, Andreas ^a  

^a UNIVERSITY OF CYPRUS   (Cyprus)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CRYSTAL GROWTH; FILM THICKNESS; GRAIN BOUNDARIES; NANOCRYSTALLINE SILICON; SEMICONDUCTING SILICON;

GRAIN BOUNDARY DISTORTIONS; SILICON FILMS; ULTRAFAST CARRIER DYNAMICS;

ULTRATHIN FILMS;

EID: 38149058358     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.200701219     Document Type: Article

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