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Volumn 17, Issue 2, 2008, Pages 127-136

Diamond surfaces polished both mechanically and manually; an atomic force microscopy (AFM) study

Author keywords

AFM; Diamond; Polishing; Surface roughness

Indexed keywords

ATOMIC FORCE MICROSCOPY; OPTICAL MICROSCOPY; POLISHING; SURFACE ROUGHNESS;

EID: 38149014706     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2007.11.006     Document Type: Article
Times cited : (21)

References (42)
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  • 2
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.