Delocalized image surface states in defect-free Si O2 hollow nanospheres

Journal of Applied Physics

Volumn 103, Issue 1, 2008, Pages

  Movilla, J L ^a   Rajadell, F ^a   Planelles, J ^a  

^a Box 224   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; DIELECTRIC MATERIALS; ELECTRONS; EXCITONS; SILICA;

DELOCALIZED IMAGE SURFACE STATES; IMAGE SELF POLARIZATION POTENTIAL; NANOSHELLS; POTENTIAL BARRIER; SHELL THICKNESSES;

NANOSPHERES;

EID: 38149005593     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2829802     Document Type: Article

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