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Volumn 124-126, Issue PART 1, 2007, Pages 275-278

Formation of high flux parallel neutral beam using a three grid system of ion beam during low angle forward reflection of ions

Author keywords

Grid system; High beam flux; Low energy; Nano scale etch; Neutral beam etching

Indexed keywords

ANGLE MEASUREMENT; ION SOURCES; LIGHT REFLECTION; MAGNETIC FLUX; NANOTECHNOLOGY;

EID: 38049039791     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/3-908451-31-0.275     Document Type: Conference Paper
Times cited : (5)

References (7)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.