Quasi-static capacitance-voltage characterizations of carrier accumulation and depletion phenomena in pentacene thin film transistors

Solid-State Electronics

Volumn 52, Issue 2, 2008, Pages 269-274

  Chen, Yi Ming ^a   Lin, Chi Feng ^a   Lee, Jiun Haw ^a   Huang, JianJang ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

C V measurement; Organic semiconductor; Thin film transistors

Indexed keywords

CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; POLYCRYSTALLINE MATERIALS; RELAXATION PROCESSES; SEMICONDUCTING ORGANIC COMPOUNDS;

C-V MEASUREMENT; DETRAP PROCESSES;

THIN FILM TRANSISTORS;

EID: 38049030175     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2007.08.020     Document Type: Article

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