Refractive and geometric lens characterization through multi-wavelength digital speckle pattern interferometry

Optics Communications

Volumn 281, Issue 5, 2008, Pages 1022-1029

  Barbosa, Eduardo A ^a   dos Santos, Silas C ^a  

^a FACULDADE DE TECNOLOGIA DE SÃO PAULO   (Brazil)

Author keywords

DSPI; Lens measurement; Speckle; Synthetic wavelength

Indexed keywords

INTERFEROMETRY; LENSES; REFRACTIVE INDEX; SEMICONDUCTOR LASERS; SPECKLE; WAVELENGTH;

CONTOUR FRINGES; DIGITAL SPECKLE PATTERN INTERFEROMETRY; LENS MEASUREMENT; MULTIMODE DIODE LASER; SYNTHETIC WAVELENGTH;

GEOMETRICAL OPTICS;

EID: 37849053699     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2007.10.077     Document Type: Article

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