Additive-subtractive two-wavelength espi contouring by using a synthetic wavelength phase shift

Applied Optics

Volumn 37, Issue 13, 1998, Pages 2591-2597

  Hack, Erwin ^a   Frei, Bruno ^a   Kästle, Ralf ^a   Sennhauser, Urs ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004825579     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.002591     Document Type: Article

References (14)

1. T. Tsuruta, N. Shiotake, J. Tsujiuchi, and K. Matsuda, “Holographic generation of contour map of diffusely reflecting surface by using immersion method, ” Jpn. J. Appl. Phys. 6, 661-662 (1967).
2. B. P. Hildebrand and K. A. Haines, “Multiple-wavelength and multiple-source holography applied to contour generation, ” J. Opt. Soc. Am. 57, 155-162 (1967).
3. H. Atcha, R. P. Tatam, C. H. Buckberry, J. C. Davies, and J. D. C. Jones, “Surface contouring using TV holography, ” in Fiber-Optic Metrology and Standards, O. D. Soares, ed., Proc. SPIE 1504, 221-232 (1991).
4. X. Peng, Y. L. Zou, H. Y. Diao, and H. J. Tiziani, “A simplified multiwavelength ESPI contouring technique based on a diode laser system, ” Optik 91 (2), 81-85 (1992).
5. G. Gulker, O. Haack, K. D. Hinsch, C. Hölscher, J. Kuls, and W. Platen, “Two-wavelength electronic speckle-pattern inter-ferometry for the analysis of discontinuous deformation fields, ” Appl. Opt. 31, 4519-4521 (1992).
6. Y. Zou, X. Peng, and H. Tiziani, “Two-wavelengthDSPI surface contouring through the temperature modulation of a laser diode, ” Optik 94 (4), 155-158 (1993).
7. T. Maack, G. Notni, and W. Schreiber, “Three-coordinate measurement of an object surface with a combined two-wavelength and two-source phase-shifting speckle interferometer, ” Opt. Commun. 115, 576-584 (1995).
8. R. Jones and C. Wykes, Holographic and Speckle Interferom-etry, 2nd ed. (Cambridge U. Press, Cambridge, UK, 1989).
9. C. Polhemus, “Two-wavelength interferometry, ” Appl. Opt. 12, 2071-2074 (1973).
10. T. C. Chatters, B. F. Pouet, and S. Krishnaswamy, “Additive-subtractive phase-modulated shearography with synchronized acoustic stressing, ” Exp. Mech. 35, 159-165 (1995).
11. L. Wang and S. Krishnaswamy, “Additive-subtractive speckle interferometry: extraction of phase data in noisy environments, ” Opt. Eng. 35, 794-801 (1996).
12. U. Vry, “Calculation of complex correlation coefficients of two speckle fields of different wavelengths and their application to two-wavelength-measurement techniques, ” J. Opt. Soc. Am. A 5, 114-125 (1988).
13. A. F. Fercher, H. Z. Hu, and U. Vry, “Rough surface inter-ferometry with a two-wavelength heterodyne speckle interferometer, ” Appl. Opt. 24, 2181-2188 (1985).
14. N. A. Ochoa, F. Mendoza Santoyo, A. J. Moore, and C. Perez Lopez, “Contrast enhancement of electronic speckle pattern interferometry addition fringes, ” Appl. Opt. 36, 2783-2787 (1997).