Exploration of complex multilayer film growth morphologies: STM analysis and predictive atomistic modeling for Ag on Ag(111)

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 3, 2008, Pages

  Li, Maozhi ^a   Chung, P W ^a   Cox, E ^a   Jenks, C J ^a   Thiel, P A ^a   Evans, J W ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 37749045685     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.033402     Document Type: Article

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