Diffraction characterization of rough films formed under stable and unstable growth conditions

Physical Review B - Condensed Matter and Materials Physics

Volumn 57, Issue 24, 1998, Pages 15541-15552

  Wollschlager J ^a   Luo, E ^a   Henzler, M ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038456677     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.15541     Document Type: Article

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