Reliability of the Heitler-London approach for the exchange coupling between electrons in semiconductor nanostructures

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 23, 2007, Pages

  Saraiva, A L ^a   Calderon M J ^b   Koiller, Belita ^a  

^a FEDERAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 37749015080     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.233302     Document Type: Article

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