Analyzer-based phase contrast imaging and phase retrieval using a rotating anode x-ray source

Applied Physics Letters

Volumn 91, Issue 25, 2007, Pages

  Vine, D J ^a   Paganin, D M ^a   Pavlov, K M ^a   Krausslich J ^b   Wehrhan, O ^b   Uschmann, I ^b   Forster E ^b  

^a MONASH UNIVERSITY   (Australia)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; FILM THICKNESS; IMAGE ANALYSIS; IMAGE RETRIEVAL; OPTICAL MICROSCOPY; X RAYS;

HIGH RESOLUTION X-RAY FILM; PHASE CONTRAST IMAGING; PLASTIC PHANTOM;

SINGLE CRYSTALS;

EID: 37549068088     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2825426     Document Type: Article

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