Measurement of electric potential distributions around FEG-emitters by electron holography

Journal of Electron Microscopy

Volumn 56, Issue 5, 2007, Pages 171-175

  Oikawa, Tetsuo ^a   Kim, Joong Jung ^b   Tomita, Takeshi ^a   Park, Hyun Soon ^b   Shindo, Daisuke ^b  

^a JEOL LTD   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Electric potential distribution; Electron holography; FEG emitter

Indexed keywords

ARTICLE; ELECTRICITY; ELECTRON; HOLOGRAPHY; INSTRUMENTATION; LABORATORY DIAGNOSIS; METHODOLOGY;

ELECTRICITY; ELECTRONS; HOLOGRAPHY; RESEARCH DESIGN; SPECIMEN HANDLING;

ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTRONS;

APPLIED VOLTAGES; DIRECTIONAL MOTION; EDGE SHAPE; ELECTRIC POTENTIAL DISTRIBUTION; FEG-EMITTER; FIELD EMISSION GUNS; MEASUREMENTS OF; PERFORMANCE; SCHOTTKY EMITTER; VOLTAGE APPLICATIONS;

ELECTRON HOLOGRAPHY;

EID: 37549039369     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfm022     Document Type: Article

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