Test structures for HF characterization of fully differential building blocks

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 1996, Pages 179-183

  Peeters, E ^a   Steyaert, M ^a   Sansen, W ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRIC IMPEDANCE; ELECTRIC VARIABLES MEASUREMENT; OPERATIONAL AMPLIFIERS; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICE STRUCTURES; SHORT CIRCUIT CURRENTS;

DIFFERENTIAL H PARAMETERS; FULLY DIFFERENTIAL BUILDING BLOCKS; LINEAR DIFFERENTIAL HYBRID PARAMETERS; S PARAMETERS; TEST STRUCTURES;

DIFFERENTIAL AMPLIFIERS;

EID: 0029713751     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)