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Volumn 130, Issue 5, 2004, Pages 317-320

Conductance of bulk samples of multiwall carbon nanotubes-metal junctions

Author keywords

A. Carbon nanotubes; D. Electronic transport; D. Tunneling

Indexed keywords

ANNEALING; ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; ELECTRODES; ELECTRON TUNNELING; IMPURITIES; MATHEMATICAL MODELS; OXIDATION; SEMICONDUCTOR JUNCTIONS;

EID: 1642587735     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2004.02.015     Document Type: Article
Times cited : (10)

References (20)
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    • Yao, Z.1    Postma, H.W.C.2    Balents, L.3    Dekker, C.4
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    • Bockrath M., Cobden D.H., Lu J., Rinzler A.G., Smalley R.E., Balents L., McEuen P.L. Nature (London). 397:1999;598 Yao Z., Postma H.W.C., Balents L., Dekker C. Nature (London). 402:1999;273 Postma H.W.C., de Jonge M., Yao Z., Dekker C. Phys. Rev. B. 62:2000;R10653.
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    • Liu K., Avouris P., Martel R., Hsu W.K. Phys. Rev. B. 63:2001;R161404 Kang N., Hu J.S., Kong W.J., Lu L., Zhang D.L., Pan Z.W., Xie S.S. Phys. Rev. B. 66:2002;R241403.
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    • Yi, W.1    Lu, L.2    Hu, H.3    Pan, Z.W.4    Xie, S.S.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.