Testing and constitutive modeling of thin polymer films and underfills by a 6-axis submicron tester

American Society of Mechanical Engineers, Applied Mechanics Division, AMD

Volumn 226, Issue , 1997, Pages 105-110

  Qian, Zhengfang ^a   Lu, Minfu ^a   Wang, Jianjun ^a   Liu, Sheng ^a  

^a Wayne State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3743099629     PISSN: 01608835     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (25)

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