메뉴 건너뛰기




Volumn 516, Issue 6, 2008, Pages 1209-1213

Microstructural features of cadmium telluride photovoltaic thin film devices

Author keywords

Cadmium telluride; Scanning electron microscopy; X ray diffraction

Indexed keywords

CADMIUM ALLOYS; GRAIN BOUNDARIES; LATTICE CONSTANTS; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS; THIN FILM DEVICES; X RAY DIFFRACTION;

EID: 37349037660     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.05.043     Document Type: Article
Times cited : (16)

References (16)
  • 1
    • 37349120309 scopus 로고    scopus 로고
    • K.L. Barth, R.A. Enzenroth, W.S. Sampath, US Patent No. 6, 423, 565, 23 July 2002.
  • 9
    • 37349059885 scopus 로고    scopus 로고
    • JCPDS-ICDD Card No. 15-0770, International Centre for Diffraction Data, Newton Square, PA.
  • 11
    • 37349093302 scopus 로고    scopus 로고
    • A. Romeo, Ph.D. Thesis, Swiss Federal Institute of Technology, Zurich, 2002.
  • 13
    • 37349103732 scopus 로고    scopus 로고
    • JCPDS-ICDD Card No. 41-1445, International Centre for Diffraction Data, Newton Square, PA.
  • 14
    • 37349058490 scopus 로고    scopus 로고
    • JCPDS-ICDD Card No. 41-1049, International Centre for Diffraction Data, Newton Square, PA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.