Characterization of CSS deposited CdTe films by electron back-scatter diffraction technique

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2005, Pages 453-456

  Cruz, L R ^a   Pinto, A L ^a   Souza, M S ^a   Moutinho, H R ^b   Dhere, R G ^b  

^a MILITARY INSTITUTE OF ENGINEERING   (Brazil)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; DIFFRACTION; GRAIN BOUNDARIES;

BOUNDARY MAPS; DIFFRACTION PATTERNS; LATTICE BOUNDARY; MICROTEXTURE;

CADMIUM ALLOYS;

EID: 27944442487     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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12. H.R. Moutinho et al., "Investigation of polycrystalline CdTe thin films deposited by physical vapor deposition, close-spaced sublimation, and sputtering", J. Vac. Sci. Technol. A 13(6), 1995, pp. 2877-2883.