Characterization of memory effects in power amplifiers using digital two-tone measurements

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 6, 2007, Pages 2757-2766

  Wisell, David H ^a,b,c   Rudlund, Björn ^d,e   Rönnow, Daniel ^b,f  

^a ERICSSON RESEARCH   (Sweden)

^b UNIVERSITY OF GÄVLE   (Sweden)

^c ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^d Racomna AB   (Sweden)

^e Omicron AB   (Sweden)

^f WESTERNGECO   (United Kingdom)

Author keywords

Amplifier distortion; Amplifiers; Measurement; Microwave; N0onlinear distortion; Power amplifiers

Indexed keywords

BANDWIDTH; COMPUTATIONAL METHODS; INTERMODULATION DISTORTION; MICROWAVES; NONLINEAR DISTORTION; POWER AMPLIFIERS; SIGNAL PROCESSING;

AMPLIFIER DISTORTION; HIGH-POWER AMPLIFIER; NYQUIST CRITERIA;

INTERMODULATION MEASUREMENT;

EID: 37249019108     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.907949     Document Type: Article

References (17)

1. O. Andersen, P. Malmlöf, and D. Wisell, "Nonlinear characterization of multiple carrier power amplifiers," in 56th ARFTG Conf. Dig., Boulder, CO, 2000, pp. 151-158.
2. J. Vuolevi, T. Rahkonen, and J. Manninen, "Measurement technique for characterizing memory effects in RF power amplifiers," IEEE Trans. Microw. Theory Tech., vol. 49, no. 8, pp. 1383-1389, Aug. 2001.
3. S. Boumaiza and F. Ghannouchi, "An accurate complex behavior test bed suitable for 3G power amplifiers characterization," in IEEE MTT-S Int. Microw. Symp. Dig., Seattle, WA, 2002, pp. 2241-2244.
4. H. Ku, M. D. Mckinley, and J. S. Kenney, "Extraction of accurate behavioral models for power amplifiers with memory effects using two-tone measurements," in IEEE MTT-S Int. Microw. Symp. Dig., Seattle, WA, 2002, pp. 139-142.
5. N. Le Gallou, E. Ngoya, H. Buret, D. Barataud, and J. M. Nebus, "An improved behavioral modeling technique for high power amplifiers with memory," in IEEE MTT-S Int. Microw. Symp. Dig., Phoenix, AZ, 2001, pp. 983-986.
6. A. Soury, E. Ngoya, and J. M. Nebus, "A new behavioral model taking into account nonlinear memory effects and transient behaviors in wideband SSPAs," in IEEE MTT-S Int. Microw. Symp. Dig., Seattle, WA, 2002, pp. 853-856.
7. J. Y. Youngoo, Y. Joongjin, N. B. Kim, and M. Park, "Measurement of two-tone transfer characteristics of high-power amplifiers," IEEE Trans. Microw. Theory Tech., vol. 49, no. 3, pp. 568-571, Mar. 2001.
8. 3 relative phase for a GaAs FET amplifier," IEEE Trans. Microw. Theory Tech., vol. 45, no. 12, pp. 2509-2514, Dec. 1997.
9. J. Proakis, Digital Communications. New York: McGraw-Hill, 1995.
10. D. Wisell and T. Öberg, "Analysis and identification of transmitter nonlinearities," in CSNDSP Conf. Dig., Bournemouth, U.K., 2000, pp. 418-421.
11. C. J. Clark, G. Chrisikos, M. S. Muha, A. A. Moulthrop, and C. P. Silva, "Time-domain envelope measurement technique with application to wideband power amplifier modeling," IEEE Trans. Microw. Theory Tech. vol. 46, no. 12, pp. 2531-2540, Dec. 1998.
12. K. G. Gard, H. M. Gutierrez, and M. B. Steer, "Characterization of spectral regrowth in microwave amplifiers based on the nonlinear transformation of a complex Gaussian process," IEEE Trans. Microw. Theory Tech., vol. 47, no. 7, pp. 1059-1069, Jul. 1999.
13. T. Söderström and P. Stoica, System Identification. Upper Saddle River, NJ: Prentice-Hall, 1989.
14. S. R. Velazquez, T. Q. Nguyen, and S. R. Broadstone, "Design of hybrid filter banks for analog/digital conversion," IEEE Trans. Signal Process., vol. 46, no. 4, pp. 956-967, Apr. 1998.
15. D. H. Wisell, "A baseband time domain measurement system for dynamic characterization of power amplifiers with high dynamic range over large bandwidths," in IEEE Instrum. Meas. Tech. Conf. Dig., Vail, CO, 2003, pp. 1177-1180.
16. N. Pothecary, Feedforward Linear Power Amplifiers. London, U.K.: Artech House, 1999.
17. J. Vuolevi and T. Rahkonen, "Extraction of a nonlinear AC FET model using small-signal S-parameters," IEEE Trans. Microw. Theory Tech. vol. 50, no. 5, pp. 1311-1315, May 2002.