Structure and magnetic property of c -axis oriented L 10 -FePt nanoparticles on TiN/ a-Si underlayers

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 25, Issue 6, 2007, Pages 1892-1895

  Tsuji, Yoshiko ^a   Noda, Suguru ^a   Yamaguchi, Yukio ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; GRAIN SIZE AND SHAPE; IRON ALLOYS; MAGNETIC PROPERTIES; MAGNETIC RECORDING; MONOLAYERS; TITANIUM COMPOUNDS;

DEPOSITION TEMPERATURE; POLYCRYSTALLINE TEMPLATES;

NANOPARTICLES;

EID: 37149051836     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2803726     Document Type: Article

References (16)

1. D. Weller, A. Moser, L. Folks, M. E. Best, W. Lee, M. F. Toney, M. Schwickert, J. -U. Thiele, and M. F. Doerner, IEEE Trans. Magn. 0018-9464 10.1109/20.824418 36, 10 (2000).
2. S. Sun, C. B. Murray, D. Weller, L. Folks, and A. Moser, Science 2000, 287 (1989). 0036-8075
3. S. Sun, C. B. Murray, D. Weller, L. Folks, and A. Moser, Science 0036-8075 10.1126/science.287.5460.1989 287, 1989 (2000).
4. S. Sun, S. Anders, H. F. Hamann, J. -U. Thiele, J. E. E. Baglin, T. Thomson, E. E. Fullerton, C. B. Murray, and B. D. Terris, J. Am. Chem. Soc. 0002-7863 10.1021/ja0176503 124, 2884 (2002).
5. B. M. Lairson, M. R. Visokay, R. Sinclair, and B. M. Clemens, Appl. Phys. Lett. 0003-6951 10.1063/1.108880 62, 639 (1993).
6. M. Watanabe and M. Homma, Jpn. J. Appl. Phys., Part 2 0021-4922 10.1143/JJAP.35.L1264 35, L1264 (1996); J. -U. Thiele, L. Folks, M. F. Toney, and D. K. Weller, J. Appl. Phys. 0021-8979 10.1063/1.368831 84, 5686 (1998).
7. M. Watanabe and M. Homma, Jpn. J. Appl. Phys., Part 2 0021-4922 10.1143/JJAP.35.L1264 35, L1264 (1996); J. -U. Thiele, L. Folks, M. F. Toney, and D. K. Weller, J. Appl. Phys. 0021-8979 10.1063/1.368831 84, 5686 (1998).
8. S. Jeong, Y. -N. Hsu, D. E. Laughlin, and M. E. McHenry, IEEE Trans. Magn. 0018-9464 10.1109/20.908421 36, 2336 (2000).
9. H. Zeng, M. L. Yan, N. Powers, and D. J. Sellmyer, Appl. Phys. Lett. 0003-6951 10.1063/1.1464663 80, 2350 (2002).
10. Z. G. Zhang, K. Kang, and T. Suzuki, Appl. Phys. Lett. 0003-6951 10.1063/1.1606492 83, 1785 (2003).
11. S. Noda, Y. Tsuji, A. Sugiyama, A. Kikitsu, F. Okada, and H. Komiyama, Jpn. J. Appl. Phys. 44, 7957 (2005). 0021-4922
12. International Center for Diffraction Data, File No. 43-1359.
13. International Center for Diffraction Data, File No. 38-1420.
14. R. Carel, C. V. Thompson, and H. J. Frost, Acta Mater. 1359-6454 10.1016/1359-6454(95)00365-7 44, 2479 (1996).
15. Y. Kajikawa, S. Noda, and H. Komiyama, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.1619414 21, 1943 (2003).
16. T. Q. Li, S. Noda, H. Komiyama, T. Yamamoto, and Y. Ikuhara, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.1598975 21, 1717 (2003).