In situ visualization of local electric field in an ultrasharp tungsten emitter under a low voltage scanning transmission electron microscope

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 25, Issue 6, 2007, Pages 2624-2627

  Fujita, Jun Ichi ^b   Ikeda, Yuta ^a   Okada, Satoshi ^a   Higashi, Kodai ^a   Nakasawa, Shotaro ^a   Ishida, Masahiko ^a,c   Matsui, Shinji ^a,d  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b UNIVERSITY OF TSUKUBA   (Japan)

^c NEC CORPORATION   (Japan)

^d UNIVERSITY OF HYOGO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COULOMB INTERACTIONS; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; SCANNING TUNNELING MICROSCOPY; TUNGSTEN;

ACCELERATING VOLTAGE; COULOMB ATTRACTION; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); ULTRASHARP TUNGSTEN EMITTERS;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 37149049311     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2800332     Document Type: Article

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