Determination of residual stress fields with high local resolution

Materials Science Forum

Volumn 524-525, Issue , 2006, Pages 279-284

  Hasse, Bernd ^a   Koçak, Mustafa ^b   Reimers, Walter ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b INSTITUTE OF MATERIALS RESEARCH   (Germany)

Author keywords

Sin 2 method; Stress determination; Synchrotron radiation; X ray imaging

Indexed keywords

DIFFRACTOMETERS; IMAGE RESOLUTION; LASER BEAM WELDING; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; SYNCHROTRON RADIATION;

DIFFRACTION METHODS; RESIDUAL STRESS FIELDS; STRESS DETERMINATION; X-RAY IMAGING;

STRESS MEASUREMENT;

EID: 37149003853     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-414-6.279     Document Type: Conference Paper

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