The influence of the macroscopic surface topography on spatially resolved residual stress measurements

Materials Science Forum

Volumn 404-407, Issue , 2002, Pages 317-322

  Tonshoff H K ^a   Ploger J ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

Local co ordinate system; Spatial resolution; Surface structure; Synchrotron radiation

Indexed keywords

DIFFRACTOMETERS; RESIDUAL STRESSES; STEEL; SYNCHROTRON RADIATION; TEMPERING; X RAY DIFFRACTION ANALYSIS;

SPATIAL RESOLUTION;

SURFACE TOPOGRAPHY;

EID: 0036429244     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.404-407.317     Document Type: Conference Paper

References (4)

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2. T. Wroblewski, O. Claus, H.-A. Crostack et. al.: A new diffractometer for material science and imaging at HASYLAB beamline G3, Nuclear Instruments and Methods in Physics Research, A 428 (1999) p. 570-582.
3. T. Wroblewski et. al.: Strain mapping by diffraction imaging, Materials science and engineering A, 2000, Vol. 288, p. 126-131.
4. V. Hauk (edt.): Structural and Residual Stress Analysis by Nondestructive Methods (Elsevier, 1997).