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Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 23, Issue 6, 2007, Pages 471-484

Estimation of test metrics for the optimisation of analogue circuit testing

(4) Bounceur, Ahcène a Mir, Salvador a Simeu, Emmanuel a Rolíndez, Luis a,b

a TIMA LABORATORY (France)

b STMICROELECTRONICS (France)

Author keywords

Analogue fault simulation; Analogue test; Catastrophic and parametric faults; Process deviations; Statistical modeling

Indexed keywords

CIRCUIT SIMULATION; GAUSSIAN DISTRIBUTION; MONTE CARLO METHODS; OPERATIONAL AMPLIFIERS; OPTIMIZATION; PARAMETER ESTIMATION; PROBABILITY DENSITY FUNCTION;

ANALOGUE FAULT SIMULATION; ANALOGUE TESTS; PARAMETRIC FAULTS; PROCESS DEVIATIONS; STATISTICAL MODELING;

ANALOG CIRCUITS;

EID: 36849063838 PISSN: 09238174 EISSN: 15730727 Source Type: Journal
DOI: 10.1007/s10836-007-5006-6 Document Type: Article

Times cited : (39)

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6
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