LACDIF, a new electron diffraction technique obtained with the LACBED configuration and a Cs corrector: Comparison with electron precession

Ultramicroscopy

Volumn 108, Issue 2, 2008, Pages 100-115

  Morniroli, J P ^a   Houdellier, F ^b   Roucau, C ^b   Puiggali J ^c   Gesti S ^c   Redjaimia A ^d  

^a UNIVERSITÉ LILLE 1   (France)

^b CEMES CNRS   (France)

^c UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

^d INSTITUT JEAN LAMOUR   (France)

Author keywords

Cs corrector; Electron diffraction; Electron precession

Indexed keywords

ELECTRON BEAMS; ELECTRON DIFFRACTION; IMAGE ANALYSIS; INTEGRATED CONTROL;

ELECTRON PRECESSION; LARGE-ANGLE CONVERGENT-BEAM ELECTRON DIFFRACTION; MICRODIFFRACTION PATTERNS; SPOT PATTERNS;

CRYSTAL STRUCTURE;

POLYMER;

AB INITIO CALCULATION; ARTICLE; CRYSTAL; ELECTRON BEAM; ELECTRON DIFFRACTION; INTERMETHOD COMPARISON; MATERIALS; MICROSCOPE; VALIDITY;

EID: 36849036332     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.03.006     Document Type: Article

References (24)

1. Vincent R., and Midgley P.A. Ultramicroscopy 53 (1994) 271
2. Gjønnes K. Ultramicroscopy 69 (1997) 1
3. Berg B.S., Hansen V., Midgley P.A., and Gjønnes J. Ultramicroscopy 74 (1998) 147
4. Gjønnes K., Cheng Y., Berg B.S., and Hansen V. Acta Crystallogr. A 54 (1998) 102
5. Gjønnes J., Hansen V., Berg B.S., Runde P., Cheng Y.F., Gjonnes K., Dorset D.L., and Gilmore C.J. Acta Crystallogr. A 54 (1998) 306
6. Gjønnes J., Hansen V., and Kverneland A. Microsc. Microanal. 10 (2004) 16
7. Gjønnes J., Hansen V., Berg B.S., Runde P., Cheng Y.F., Gjønnes K., Dorset D.L., and Gilmore C.J. Acta Crystallogr. A 54 (1998) 306
8. Weirich T., Portillo J., Cox G., Hibst H., and Nicolopoulos S. Ultramicroscopy 106 (2006) 164
9. Own C.S., Sinkler W., and Marks L.D. Ultramicroscopy 106 (2006) 114
10. Kverneland A., Hansen V., Vincent R., Gjønnes K., and Gjønnes J. Ultramicroscopy 106 (2006) 492
11. Morniroli J.P., Redjaïmia A., and NIcolopoulos S. Ultramicroscopy 107 (2007) 514
12. Midgley P.A., Sleight M.E., Saunders M., and Vincent R. Ultramicroscopy 75 (1998) 61
13. Own C.S., Subramanian A.K., and Marks L.D. Microsc. Microanal. 10 (2004) 96
14. Own C.S., Marks L.D., and Sinkler W. Acta Crystallogr. A 62 (2006) 434
15. Li X.Z. J. Appl. Crystallogr. 36 (2003) 956
16. Haider M., Rose H., Uhlemann H., Schwan E., Kabius B., and Urban K. Nature 392 (1998) 768
17. Convergent-Beam Electron Diffraction of Alloy Phases, The Bristol Group (Compiled by J. Mansfield), Adam Hilger, Bristol, 1984.
18. Tanaka M., and Terauchi M. Convergent-Beam Electron Diffraction vol. I (1985), JEOL, Tokyo
19. Tanaka M., Saito R., Ueno K., and Harada Y. Journal of Electron Microscopy 29 (1980) 408
20. J.P. Morniroli, Large-Angle Convergent Beam Electron Diffraction. Applications to Crystal Defects, Monograph of the SFμ, Paris, 2002.
21. Humphreys C.J., Maher D.M., Frazer H.L., and Eaglesham D.J. Philos. Mag. 58 (1988) 787
22. Brunner M., Kohl H.J., and Niedrig N. Optic 58 (1981) 37
23. Morniroli J.P., and Steeds J.W. Ultramicroscopy 45 (1992) 219
24. Redjaimia A., and Morniroli J.P. Ultramicroscopy 53 (1994) 30