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Volumn 1, Issue 2, 2006, Pages 258-274

Chip analysis for the determination of flank wear in dry turning

Author keywords

chip characteristics; Confidence Interval (CI); dry turning; empirical model; flank wear

Indexed keywords


EID: 36749007653     PISSN: 17485711     EISSN: 1748572X     Source Type: Journal    
DOI: 10.1504/ijmmm.2006.011062     Document Type: Article
Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.