SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 716, Issue , 2002, Pages 189-195

Composite X-ray waveguide-resonator as a background for the new generation of the material testing equipment for films on Si substrates

(2) Egorov, V K a Egorov, E V a

a RUSSIAN ACADEMY OF SCIENCES (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE REFLECTION; MATERIALS TESTING; OPTICAL RESONATORS; OPTICAL WAVEGUIDES; SEMICONDUCTING SILICON; SUBSTRATES; THIN FILMS;

COMPOSITE PLANAR X RAY WAVEGUIDE RESONATOR; ELECTROMAGNETIC RADIATION BEAM; X RAY BEAM PENETRATION; X RAY STANDING WAVE;

X RAY OPTICS;

EID: 0036950840 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: 10.1557/proc-716-b4.15 Document Type: Conference Paper

Times cited : (13)

References (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.