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Volumn 7, Issue 9, 2007, Pages 3348-3349
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Nanoplough-constrictions on thin YBCO films made with atomic force microscopy
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Author keywords
AFM; Constriction; Josephson junction; Nanoploughing; YBCO thin film
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Indexed keywords
ATOMIC FORCE (AF);
ATOMIC FORCE MICROSCOPE (AFM);
DIAMOND TIPS;
EPITAXIALLY GROWN;
ATOMIC FORCE MICROSCOPY;
ATOMS;
DIAMONDS;
EXTREME ULTRAVIOLET LITHOGRAPHY;
MICROSCOPIC EXAMINATION;
SCANNING PROBE MICROSCOPY;
YTTRIUM BARIUM COPPER OXIDES;
ATOMIC PHYSICS;
ALUMINUM;
BARIUM;
COPPER;
DIAMOND;
MAGNESIUM OXIDE;
METAL NANOPARTICLE;
NANOPARTICLE;
YTTRIUM;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMISTRY;
CRYSTALLIZATION;
ELECTROCHEMISTRY;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
SURFACE PROPERTY;
ALUMINUM;
BARIUM;
COPPER;
CRYSTALLIZATION;
DIAMOND;
ELECTROCHEMISTRY;
MAGNESIUM OXIDE;
MATERIALS TESTING;
METAL NANOPARTICLES;
MICROSCOPY, ATOMIC FORCE;
NANOPARTICLES;
NANOTECHNOLOGY;
SURFACE PROPERTIES;
YTTRIUM;
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EID: 36448949013
PISSN: 15334880
EISSN: None
Source Type: Journal
DOI: 10.1166/jnn.2007.892 Document Type: Article |
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Times cited : (5)
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References (8)
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