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Volumn 30, Issue 16, 2007, Pages 2570-2582

Comparative TOF-SIMS and MALDI TOF-MS analysis on different chromatographic planar substrates

Author keywords

Fragmentation; Hyphenation; MALDI TOF MS; TLC MS; TOF SIMS

Indexed keywords

ORGANIC ACIDS; RAMAN SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SILICA GEL;

EID: 36448946898     PISSN: 16159306     EISSN: 16159314     Source Type: Journal    
DOI: 10.1002/jssc.200700120     Document Type: Article
Times cited : (10)

References (29)
  • 1
    • 0003672545 scopus 로고    scopus 로고
    • John Wiley & Sons, Chichester, New York, Weinheim, Brisbane, Singapore, Toronto
    • Vickerman, J. C., Surface Analysis, John Wiley & Sons, Chichester, New York, Weinheim, Brisbane, Singapore, Toronto 1997.
    • (1997) Surface Analysis
    • Vickerman, J.C.1
  • 3
    • 36448951831 scopus 로고    scopus 로고
    • Karas, M., Why MALDI Works-From Hypothesis to Experimental Evidence. SIMS XV, Manchester 2005, Book of Abstracts, p. 18.
    • Karas, M., Why MALDI Works-From Hypothesis to Experimental Evidence. SIMS XV, Manchester 2005, Book of Abstracts, p. 18.
  • 4
    • 33747165210 scopus 로고    scopus 로고
    • The Use of MALDI Matrices for Ion Yield Enhancement in Static SIMS Experiments
    • Munster, Book of Abstracts, p
    • Adriaensen, I., Vangaever, F., Lenaerts, J., Gijbels, R., The Use of MALDI Matrices for Ion Yield Enhancement in Static SIMS Experiments. SIMS Europe 2004, Munster 2005, Book of Abstracts, p. 90.
    • (2005) SIMS Europe 2004 , pp. 90
    • Adriaensen, I.1    Vangaever, F.2    Lenaerts, J.3    Gijbels, R.4
  • 5
    • 36448932603 scopus 로고    scopus 로고
    • Locklear, J. E., Guillermier, C., Verkhoturov, S. V., Schweikert, E. A., Matrix-Assisted Cluster-SIMS. SIMS XV, Manchester 2005. Book of Abstracts, p. 171.
    • Locklear, J. E., Guillermier, C., Verkhoturov, S. V., Schweikert, E. A., Matrix-Assisted Cluster-SIMS. SIMS XV, Manchester 2005. Book of Abstracts, p. 171.
  • 6
    • 36448960064 scopus 로고    scopus 로고
    • Delcorte, A., Matrix Enhanced Secondary Ion Mass Spectrometry. SIMS XV, Manchester 2005, Book of Abstarcts, p. 170.
    • Delcorte, A., Matrix Enhanced Secondary Ion Mass Spectrometry. SIMS XV, Manchester 2005, Book of Abstarcts, p. 170.
  • 7
    • 36448935926 scopus 로고    scopus 로고
    • Michaelis, D., Jiang, G., Parent, A., Anderson, T., Savage, P. B., Linford, M. R., Direct ToF-SIMS Analysis of Thin Layer Chromatography Plates. SIMS XV, Manchester, 2005. Book of Abstracts, p. 186.
    • Michaelis, D., Jiang, G., Parent, A., Anderson, T., Savage, P. B., Linford, M. R., Direct ToF-SIMS Analysis of Thin Layer Chromatography Plates. SIMS XV, Manchester, 2005. Book of Abstracts, p. 186.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.