Introduction to time-of-flight secondary ion mass spectrometry application in chromatographic analysis

Journal of Chromatography A

Volumn 1084, Issue 1-2, 2005, Pages 113-118

  Oriňák, Andrej ^a   Arlinghaus, Heinrich F ^b   Vering, Guido ^b   Oriňáková, Renáta ^a   Hellweg, Sebastian ^b  

^a P J AFÁRIK UNIVERSITY   (Slovakia)

^b UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

Giberrelic acid; Interfacing; Methyl Red; Terpinolen; Thin layer chromatography; TOF SIMS

Indexed keywords

CONCENTRATION (PROCESS); MIXTURES; SILICA; THIN LAYER CHROMATOGRAPHY;

CHROMATOGRAPHIC MIXTURES; SURFACE DEPOSITION; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY (TOF-SIMS); ULTRATRACE ANALYSIS;

SECONDARY ION MASS SPECTROMETRY;

ALUMINUM; GIBBERELLIC ACID; METHYL RED; TERPINOLENE;

ANALYTIC METHOD; CHEMICAL ANALYSIS; CONFERENCE PAPER; PRIORITY JOURNAL; SURFACE PROPERTY; THIN LAYER CHROMATOGRAPHY; TIME OF FLIGHT MASS SPECTROMETRY;

BRIDGED COMPOUNDS; CHROMATOGRAPHY, THIN LAYER; SPECTROMETRY, MASS, SECONDARY ION;

EID: 22044448757     PISSN: 00219673     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.chroma.2004.09.056     Document Type: Conference Paper

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